The scans were held for 10 min, allotting sufficient time to collect a full spectrum. Scanning line dwell time was set at 5 μs for a 512×512 pixel frame, with an average detector saturation dead time of 30–40%, depending on the area and magnification.

The EDX mapping hardware has four windowless Super-X SDD detectors. We present this data for critical and/or extended analysis from the scientific community, with applications applying to: experimental data correlation, confirmation of results, and as computer based modeling inputs. This in-situ experiment is deemed ‘ quasi’ due to the thin foil irradiation taking place at an external TEM facility. Furthermore included are the two quasi in-situ HAADF images for visual comparison of the regions before and after irradiation. The.raw files from the Bruker Esprit v1.9 output are additionally included along with the.rpl data information files. keV energy) of the quasi in-situ scanned region (512×512 pixels at 56k magnification), along with the EDX scanning parameters. The data includes the spectral (counts vs. The vendor software used to process and output the data is the Bruker Esprit v1.9 suite. The data presented contains two sets of energy dispersive X-ray spectroscopy (EDX) data collected before and after irradiation to 1.5 displacements-per-atom (~1.25×10 −3 dpa/s with 7.5×10 14 ions cm −2). Quasi in-situ analysis during 1 MeV Kr 2+ 520 ☌ irradiation allowed the same microstructural area to be observed using a transmission electron microscope (TEM), on an oxide dispersion strengthened (ODS) austenitic stainless steel sample.

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